Analog-to-Digital
Conversion Methods and Apparatus Enabled by Active and/or Passive
Variable Delay Transmission Lines
Description
Technology scaling
adversely affects most parameters relevant to analog design,
and ADCs are no exception. To achieve a high linearity, high
sampling speed, and high dynamic range with low supply voltages
and low power dissipation in ultra-deep submicron silicon
technology is a major challenge. Moreover, as scaling continues,
the intrinsic gain keeps decreasing, indicating that the device
performance for precision analog devices decreases with continued
scaling. Also, the explosive growth in wireless and wireline
communications is driving the demand for high-resolution,
high-speed, low-power, and low-cost integrated ADCs.
The invention
provides an ADC (analog-to-digital converter) that utilizes
active and/or passive variable-delay transmission lines to
determine the digital signal. In preferred embodiments, to
quantize an analog input signal, the propagation constant
of traveling electronic wave is modulated parametrically by
the input signal. Subsequently, at a plurality of coordinates
within the path of the traveling wave, the time to arrival
of the traveling wave is compared to a reference waveform.
The collective results of these comparisons are then used
to evaluate and subsequently quantize the input signal.
Benefits
- High speed,
low power, and fully digital analog-to-digital conversion
- More power efficient than traditional
ADCs, predominantly in integrated ADCs built using different
semiconductor substrates
- Advantageous in deep sub-micron integrated
circuit processes
- Allows scalability
Features
- The time difference between different
travelling waves is compared, in contrast to the traditional
ADCs where voltage levels are compared.
Market Potential/Applications
Analog and mixed-signal circuit design
companies
For further information please contact:
University of Texas,
Austin, USA
Website : www.otc.utexas.edu

|