Optical Film Thickness Monitor

Introduction

This is a versatile electronic instrument which uses a solar cell to monitor and control, during deposition, the thickness of transparent films used for making solar cells. The instrument can be used in either reflection or transmission mode. It can also be used to make interference filters of various types viz. reflectors, edge filters, Fabry-Perot type, etc.

Salient features:

Chopper frequency: 300Hz to eliminate interference from lamps and room light. The accuracy in thickness measurements is l/100. A stable light source (24W tungsten lamp) is operated by an in - built, stabilized 6V dc power supply. X - Y recorder outputs in both current and voltage modes are available to obtain a plot of the deposition on a recorder. Measure the thickness of transparent films in situ.

Prospective Users: Vacuum component / instrument manufacturers

Keywords: Film, thickness, monitor

Type of Technology: Instrument

Developed by : Dr. K A Mukherjee
Department: Center for Energy Studies

Contact:

Managing Director
Foundation for Innovation and Technology Transfer (FITT)
Indian Institute of Technology, Delhi
Hauz Khas, New Delhi-110016, INDIA
Tel : 91-011-26597167, 26857762, 26581013, 26597153
Fax : 91-011-26851169
E-mail : drkdpn@gmail.com