Electronics & Communication
Technologies
- Optical Film Thickness Monitor
Introduction
This is a versatile electronic instrument which uses
a solar cell to monitor and control, during deposition,
the thickness of transparent films used for making solar
cells. The instrument can be used in either reflection
or transmission mode. It can also be used to make interference
filters of various types viz. reflectors, edge filters,
Fabry-Perot type, etc.
Salient features:
Chopper frequency: 300Hz to eliminate interference
from lamps and room light. The accuracy in thickness
measurements is l/100. A stable light source (24W tungsten
lamp) is operated by an in - built, stabilized 6V dc
power supply. X - Y recorder outputs in both current
and voltage modes are available to obtain a plot of
the deposition on a recorder. Measure the thickness
of transparent films in situ.
Developed by : Dr. K A
Mukherjee Department: Center for
Energy Studies
Contact:
Managing Director
Foundation for Innovation and Technology Transfer (FITT)
Indian Institute of Technology, Delhi
Hauz Khas, New Delhi-110016, INDIA
Tel : 91-011-26597167, 26857762, 26581013, 26597153
Fax : 91-011-26851169
E-mail : drkdpn@gmail.com
